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Original Date: 05/01/2000
Revision Date: 01/18/2007
Information : Vertically Integrated Test Equipment
Traditional test approaches have included multiple configurations of test equipment which provided test capabilities across the product life cycle. The result of this low degree of test product commonality increased prime equipment support costs as well as acquisition and maintenance support of the test products. Northrop Grumman Defensive Systems Division (DSD) developed an alternative approach for test support by merging three separate test equipment developments.
The Vertically Integrated Test Equipment combines (1) the common tester for the factory and depot support of the AN/ALQ-135, (2) the general purpose, electro-optical (EO) test asset product, and (3) the integrated family of test equipment, general purpose, automated test equipment product line. These three test equipment developments have successfully driven the company’s factory, depot, and intermediate level test functions toward a common technology base. The next goal is to inset the common test resources into the prime equipment development cycle.
The Vertically Integrated Test Equipment optimizes Northrop Grumman DSD’s value-added in the test product area. Among these include maximizing the use of commercial open system architecture elements; targeting high-profile technical niches which require considerable investment but have long-term marketability; and providing system integration and standardization to preserve test program investment.
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