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Original Date: 07/25/2005
Revision Date: 09/12/2006
Information : System Built-In Test Utilization in Factory Test Environment Design
Northrop Grumman Electronic Systems implemented a dual-tiered approach to meet testing requirements by implementing hardware and software in the design phase of both Built-In Test and Factory Test Environment.
To meet requirements of cost, schedule, and performance, Northrop Grumman Electronic Systems (NGES) implemented a dual-tiered approach for testing in the design phase. The Built-In Test (BIT) phase focuses on detecting and isolating functional hardware failures by using software and providing identification of faults to an automated database. The Factory Test verifies that the design meets its required operational environment, that it has been built and tested to the customer’s requirements, and that it meets the contractual Mission Need Statement. With these two areas of early design testing, NGES benefits by receiving test data in field-deployed units and by making the necessary changes to production units in the Factory Test Environment (FTE). This early assessment allows NGES to assign levels of risk and action items to factory personnel, technicians, engineers, providing sufficient lead-time for reconfiguring the functional baseline to implement changes, meet requirements, and close action items.
NGES uses a vertical testability matrix (Figure 3-1) that allows changes to be made in the FTE through technology insertion or technology refresh if and when changes must to be implemented. The changes are attributable to automatically reconfiguring the BIT hardware and software interfaces and to providing automatic fault isolation to meet the FTE. Once the FTE is met, the Depot Level Test can also be reconfigured through the use of field changes, maximizing the operational availability to support the Mission Need Statement. BIT and FTE are implemented at NGES as standard company policy for contractual purposes and include interaction with NGES customers through the use of Integrated Product Teams (IPTs).
Figure 3-1. Vertical Testability
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