Original Date: 07/25/2005
Revision Date: 09/12/2006

Northrop Grumman Electronic Systems stores all test data in a common Test Data database in text format for general accessibility from any PC on the Intranet.

Northrop Grumman Electronic Systems (NGES) previously stored and analyzed test data at each test location separately, and results were not immediately accessible to other involved personnel and management. As a result, comprehensive analysis of data for predicting trends and process yields was difficult and time-consuming. NGES developed a Test Data Database that could be accessed from any PC on the Intranet. All test data are now stored and archived in a new database in text format for general accessibility. Numerical data can be imported into Excel spreadsheets for analysis as needed by different users. Simple analysis can detect yield detractors from historical data and predict future yield problems. Composite analysis of measured parameters is used in design margin analysis to produce capability charts and predict process yields. Control charts are generated to perform trend analysis and spot anomalies.

An important feature of the database is the Test Logbook Record style that allows review of current status from any networked PC, linking front-line test, supervision, and test engineering. The Test Logbook Record style, with its many filtering capabilities, is a significant improvement over less sophisticated standard database formats. Continuing feedback from multiple users is making this innovative approach to database structure and management an increasingly useful tool to NGES.

For more information see the Point of Contact for this survey.