The two parameters collected on the MUST were analyzed to generate the mean and standard deviation for each of the ten categories mentioned above. The analysis was accomplished using the RS1 statistical package with an EMPF generated program.

Each of the categories were tested for normality using the Wilk-Shapiro test. After the categories were tested for normality, t-tests and F-tests were performed to determine if the various fluxing and tinning processes significantly changed the solderability of the terminals. The t-test examines the hypothesis that the mean time to F = 0 and 2/3 Fmax is equal after the fluxing and tinning operations. The F-test examines the hypothesis that the variances of the estimated means are equal after the fluxing and tinning operations. The purpose of these two statistical tests was to determine if the wetting times can be decreased, and if the wetting is more uniform by using a particular flux or tinning operation. A decrease in the variance would be an indicator of more uniform wetting.

The following t-tests and F-tests were performed.

Connector No. 1

Category (1) (As received) versus

Category (2) (Tinned in RMA)

Category (1) (As received) versus

Category (3) (Tinned in RMA, extracted quickly)

Category (1) (As received) versus

Category (4) (Tinned in RA)

Category (1) (As received) versus

Category (5) (Tinned in OA)

Connector No. 2

Category (6) (As received) versus

Category (7) (Steam aged)

Category (6) (As received) versus

Category (8) (RMA/Steam aged)

Category (6) (As received) versus

Category (9) (RA/Steam aged)

Category (6) (As received) versus

Category (10) (OA/Steam aged)