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Methods&Metrics: Methods & Metrics for Product Success |
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Acknowledgments
| Editor: |
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Willis J. Willoughby, Jr., Office of the
Assistant Secretary of the Navy for Research, Development Acquisition [OASN (RD&A)]
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| Technical Editor: |
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Douglas O. Patterson, OASN (RD&A)
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| Contributing
Editors: |
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William A. Finn, Martin
Marietta Edward I. Smith, OASN
(RD&A) Elwood P. Padgett, Martin
Marietta
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| Production
Editors:
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Maye A.
Hardin, By Design Beth D. Woods, By Design
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| Techncial
Writers: |
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Victor Barnes, Naval
Warfare Assessment Division Mike McCune, Naval
Warfare Assessment Division
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| Contributors: |
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Philip W.
Cheney, Raytheon Company James H. Evertt,
AT&T Frank S. Goodall, Boeing Defense &
Space Group Ken J. Jenson, Alliant Techsystems,
Inc. Clint O. Larson, Honeywell Fred I.
Palmer, Martin Marietta John W. Steurer,
McDonnell Douglas Aerospace Jack E. Swindle, Texas Instruments
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| Reviewers: |
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Gene H.
Porter, Office of the Under
Secretary of Defense, Acquisition & Technology [OUSD (A&T)] Ben Kenneth G.
Miller, U.S. Air Force Stephen R. Burdt,
U.S. Army Ernie Renner, Office of Naval
Research Brian Willoughby, Computer Sciences
Corporation |
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