Design for testability
for status monitoring.
of failure modes, including interconnection failures, specified to be the
basis for test design.
for failure coverage (% detection) using full test resources.
for failure coverage using BIT.
for failure coverage using only the monitoring of operational signals by
for maximum failure latency for BIT.
for maximum acceptable BIT false alarm rate; definition of false
for fault isolation to a replaceable item using BIT.
for fault isolation times.
on BIT resources in items of hardware size, weight and power, memory size
and test time.
for BIT hardware reliability.
for automatic error recovery.
for fault detection consistency between hardwere levels and maintenance