Do state diagrams for sequential circuits identify invalid sequences
and indeterminate outputs?
If a Computer-Aided Design system is used for design, does the CAD
data base effectively support the test generation process and test
For Large Scale Integrated Circuits used in the design, are data
available to accurately model the LSIC and generate high-confidence
tests for it?
For computer-assisted test generation, is the available software
sufficient in terms of program capacity, fault modeling, component
libraries, and post-processing of test response data?
Are testabtlty features included by the system designer documented in
the TRD in terms of purpose and rationale for the benefit of the test
Is a mechanism available to coordinate configuration changes with
test personnel in a timely manner?
Are test diagrams included for each major test? Is the diagram
limited to a small number of sheets? Are inter-sheet connections clearly
Is the tolerance band known for each signal on the