Texas Instruments developed a central data base providing all worldwide TI locations real-time access to TI failure analysis data. The Failure Analysis Data Base (FADB) is one of many central data bases available through TI's global network. Centrally located in Dallas, Texas with remote access to all TI locations, FADB can be accessed from any TI facility in the world. All data is continually on-line and updated in real-time.
The FADB contains data from in-house testing as well as field failure results. Sixty-four fields are stored for each record, allowing flexible query displays for several applications. This information - together with TI's worldwide network - provides a powerful cross-reference tool. For example, devices rejected during the assembly process can be quickly referenced for historical data to determine if there is a repetitive trend, thereby saving valuable manufacturing time. The problem trend could be in-house, company-wide, or it might be reflected by field failures/returns. Information on a rejected part can be searched to find what failure analysis tests have been done and whether or not a continuing problem exists. The FADB provides the analyst a third hand in quick resolution of an encountered anomaly.
The FADB is a powerful and flexible tool for both analyst and manager. TI's worldwide network allows "univision" of in-house and field failure data to all TI facilities, creating an effective global tool.