A representative from the Best Manufacturing Practices (BMP) Program and Center of Excellence (COE) was among attendees at the Sixteenth Annual Single Event Effects (SEE) Symposium April 10-12, 2007 at the Renaissance Long Beach Hotel in Long Beach, California. This year’s meeting, which was jointly supported by the Defense Threat Reduction Agency (DTRA), the NASA Electronic Parts and Packaging Program, the Aerospace Corporation, Vanderbilt University, and the Boeing Corporation, provided a forum for the 130 conference attendees to discuss and exchange the latest information regarding SEE in microelectronic and photonic devices, circuits, and systems. Attendees participated in technical sessions focused on mechanisms and modeling, testing issues, reconfigurable devices, environments, and devices and integrated circuits (ICs). Attendees also heard panel discussions on updating SEE test standards and proposed upgrades to the 1996 version of the Cosmic Ray Effects on Micro-Electronics model (CRÈME96). The Single Event Effects (SEE) Symposium is a forum dedicated to the understanding of radiation-induced SEE in microelectronics and photonics. BMP’s participation in this event represents the Center’s support of sharing best practices and resources in support of the DoD.